Products
Browse our complete range of precision instruments for ion beam analysis, from individual lenses and beam components to complete microbeam endstage systems.
Lenses

OM50
The OM50 is the standard magnetic quadrupole singlet lens, featuring novel integral construction cut to micron precision from a single stress-relieved billet of high quality magnet iron.

OM52
The OM52 is a miniature quadrupole singlet lens with extended poles, designed for short lens systems. It uses the same high precision construction as the standard OM50 lens.

OM55
The OM55 is a high strength quadrupole singlet lens designed for focusing high rigidity ions. Externally identical to the standard OM50 lens.
Lens Systems

OM100
The OM100 is a basic doublet comprising two OM50 lenses mounted on a precision micrometer controlled table for easy alignment.

OM150
The OM150 is an enhanced focusing coupled triplet system comprising three OM50 lenses, delivering submicron performance with high beam transmission.

OM170
The OM170 is a monobloc triplet of pre-aligned OM52 lenses designed for vertical mounting. Its compact assembly uses precision ground spacers for accurate alignment.
Power Supplies
Beam Components

OM10
Precision differential micrometer controlled beam defining slits for accurate beam shaping and divergence control.

OM25
Compact box deflector enabling MeV ions to be rastered over the sample, constructed with ferrite cored pre-lens deflector coils.

OM40e
A twin channel power amplifier designed to drive the OM25 deflection coils for precise beam scanning control.

OM35e
An ultra-sensitive charge digitiser, scaler and current indicator for precise beam current measurement.
Target Chambers
Complete Systems

OM2000
A complete ion microbeam endstage integrating the target chamber, triplet lens assembly, scan system and beam divergence limiter slits on an integral support table.

OM2020
A stand-alone external beam endstage for in-air applications such as archaeometry, featuring doublet focusing on a single pillar mount.

OM2050
An external beam add-on that attaches to the back port of the OM70 target chamber, offering a simple low-cost option for in-air applications such as archaeology.


